Quantification of magnetic force microscopy images using combined electrostatic and magnetostatic imaging
نویسندگان
چکیده
A method for calibrating the force gradients and probe magnetic moment in phase-contrast magnetic force microscopy ~MFM! is introduced. It is based upon the combined electrostatic force microscopy EFM and MFM images of a conducting non magnetic metal strip. The behavior of the phase contrast in EFM is analyzed and modeled as a finite area capacitor. This model is used in conjunction with the imaging data to derive the proportionality constant between the phase and the force gradient. This calibration is further used to relate the measured MFM images with the field gradient from the same conducting strip to derive the effective magnetic moment of the probe. The knowledge of the phase-force gradient proportionality constant and the probe’s effective moment is essential to directly quantify field derivatives in MFM images. © 1998 American Institute of Physics. @S0021-8979~98!27711-5#
منابع مشابه
Effects of Long-Range Tip-Sample Interaction on Magnetic Force Imaging: A Comparative Study Between Bimorph Driven System and Electrostatic Force Modulation
Magnetic force microscopy (MFM) using electrostatic force modulation has been designed and developed to avoid the drawbacks of the bimorph driven system. The bimorph driven system has poor frequency response and overlap of the topographic features on magnetic structures of the MFM images. In the electrostatic force modulation system, the amplitude increases in the noncontact regime as the tip a...
متن کاملRemoval of electrostatic artifacts in magnetic force microscopy by controlled magnetization of the tip: application to superparamagnetic nanoparticles
Magnetic force microscopy (MFM) has been demonstrated as valuable technique for the characterization of magnetic nanomaterials. To be analyzed by MFM techniques, nanomaterials are generally deposited on flat substrates, resulting in an additional contrast in MFM images due to unavoidable heterogeneous electrostatic tip-sample interactions, which cannot be easily distinguished from the magnetic ...
متن کاملMagnetic force microscopy using fabricated cobalt-coated carbon nanotubes probes
Magnetic force microscope ( MFM ) is a powerful technique for mapping the magnetic force gradient above the sample surface. Herein, single-wall carbon nanotubes (SWCNT) were used to fabricate MFM probe by dielectrophoresis method which is a reproducible and cost-effective technique. The effect of induced voltage on the deposition manner of carbon nanotubes (CNT) on the atomic force microscope (...
متن کاملAtomic Force Microscopy Application in Biological Research: A Review Study
Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...
متن کاملAC driven magnetic domain quantification with 5 nm resolution
As the magnetic storage density increases in commercial products, e.g. the hard disc drives, a full understanding of dynamic magnetism in nanometer resolution underpins the development of next-generation products. Magnetic force microscopy (MFM) is well suited to exploring ferromagnetic domain structures. However, atomic resolution cannot be achieved because data acquisition involves the sensin...
متن کامل